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为探究小麦根系性状与地上形态及产量性状的关系，促进小麦根系性状的改良，本研究选用48个遗传背景丰富的冬小麦品种，用室内卷纸法测定小麦苗期根系性状，用电容法测定小麦灌浆中期根系电容值，并利用大田挖掘法测定13个苗期根系差异较大的小麦品种灌浆中期的总根长、总根表面积和总根体积等根系性状，分析小麦根系性状与地上部形态及产量性状间的关系。结果表明，灌浆中期小麦根系电容值与苗期各根系性状均呈显著正相关，与灌浆中期总根长和总根表面积呈显著正相关；进一步分析表明，灌浆中期小麦根系电容值与株高、穗下茎长和旗叶长均呈极显著正相关，而与旗叶宽呈显著负相关，与小穗数、千粒重和单株产量均呈极显著正相关。基于根系电容值高低将小麦分为3类，其中，高电容值小麦和低电容值小麦在上述地上形态及产量性状上均存在显著差异。小麦苗期根系性状和小麦灌浆中期根系电容值均与千粒重和小穗数有较高的相关性。综上可见，小麦根系电容值可较好地反映小麦生长后期根系性状，与根系电容值显著相关的地上形态及产量性状如株高、小穗数、千粒重等可考虑作为小麦根系的替代性状。

英文摘要:

In order to study the relationship between wheat root traits and shoot morphology, yield traits, and to promote the improvement of wheat root traits,we selected 48 winter wheat varieties with rich genetic background and measured the root traits of wheat at seedling stage by indoor paper rolling method and root electrical capacitance value at mid-grain filling stage by electrical capacitance method.The root traits were determined at mid-grain filling stage of 13 wheat varieties with large differences in the root system at seedling stage.The relationship between wheat root traits and shoot morphology,and yield traits was analyzed. In summary, our study suggested that the electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with the root traits at seedling stage, and was significantly positively correlated with total root length and total root surface area at mid-grain filling stage. Further analysis showed that the electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with plant height, peduncle length and flag leaf length, and significantly negatively correlated with flag leaf width. The electrical capacitance value of the wheat root system at mid-grain filling stage was significantly positively correlated with spikelet number per spike, thousand-grain weight and yield per plant. The wheat varieties were divided into three categories including by root electrical capacitance value. There were significant differences between wheat varieties with high and low electrical capacitance values in the above-mentioned agronomic traits.The root trait at seedling stage of wheat and the root electrical capacitance value at mid-grain filling stage of wheat have high correlation with thousand-grain weight and spikelet number per spike. In summary, wheat root electrical capacitance value can better reflect the root traits of wheat in the late stage of growth.The shoot morphology,and yield traits which are significantly related to root electrical capacitance value, such as plant height, spikelet number per spike and thousand-grain weight, can be considered as alternative traits of wheat root traits.

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