| It is well known that lodging resistance has been improved efficiently by utilization of the semi-dwarf cultivars in wheat.However,excessive reduction of plant height will lead to the decrease of yield.In order to determine key lodging-resistant traits except for plant height,two groups of wheat cultivars and breeding lines with different lodging-resistant levels were used to evaluate 13 lodging-associated traits in this study.One group consists of the lodging resistant cultivars and breeding lines,including Shi 4185,Lunxuan 103,Lunxuan 163,Lunxuan 126,Aikang 58,Xiaoyan 101 and Zhoumai 18,and the other group is composed of lodging-susceptible cultivars and breeding lines,including Lunxuan 49,Lunxuan 136,Zhongmai 875,Lunxuan 87 and Lunxuan 199.Thirteen lodging-assoicated traits were evaluated in this study.The results showed that the group of lodging-resistant wheat accessions had shorter plant height,shorter and thicker basal 1-2 internodes,thicker second internode wall,greater number of large and small vascular bundles,thicker parenchyma and sclerenchyma tissues,and stronger stem breaking strength.The significant differences(P≤ 0.05) were detected between the two groups in plant height,length of the second internode,number of small vascular bundle,width of sclerenchyma tissue and stem breaking strength.It was noticed that different lodging-resistant lines had different lodging-resistant characteristics.The correlation and principal component analyses showed that plant height,length of second internode and stem breaking strength were the key characters in determining the lodging difference between the two groups of wheat accessions,indicating that these three traits could be used as main criteria in selection for lodging resistance in wheat breeding program. |
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