| Cuticular wax is an important trait for wheat adaption to environmental changes, and plays an important role in the protection against adverse stresses such as diseases, pests, drought and high temperature. In order to establish a rapid method to estimate cuticular wax content in leaf of wheat, the high wax content line 2912, low wax content varieties Pubing 201 and Jinmai 47, and their derived F2:3 lines were used as materials, their cuticular wax contents of flag leaf at flowering stage were determined using the conventional method, and their canopy reflection spectrum were taken at the same time using Fieldspec 3, then the relationship between canopy spectral reflectance and leaf cuticular wax content was investigated to observe the sensitive wave band and spectral characteristic parameters, which could reflect wheat leaf wax content. The results indicated that there were significant differences in wax content between the parents and among the F2:3 lines; among the curve of canopy reflectance spectrum, the reflectance value in the visible region of materials with high cuticular wax content were higher than that of those with low cuticular wax content, and higher correlation was observed in the short wavelength band between leaf cuticular wax content and spectral reflectance value; the single wave/differential reflective index R550/(R550-R675) was proposed to estimate the leaf cuticular wax content of wheat, compared with other existing reflectance parameters, the fitting degree of this index was the highest, with R value for the two populations as 0.761 and 0.679, respectively; and the proposed regression equation was y=0.07x-0.575 and y=0.088x-1.481 for the two populations, respectively. The established non destructive and rapid determination method of leaf wax content will promote the works on rapid determination of wheat leaf wax content and the related studies in the future. |
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