| 肖 磊，杨 苑，李瑞航，谢利萍，邵景侠，郭蔼光，徐 虹.低温条件下小麦返白系叶片中H2O2累积的原因初探[J].麦类作物学报,2019,(3):338 |
| 低温条件下小麦返白系叶片中H2O2累积的原因初探 |
| The Reasons for H2O2 Accumulation in Leaves of Wheat Albinism line under Low Temperature |
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| DOI：10.7606/j.issn.1009-1041.2019.03.12 |
| 中文关键词: 小麦返白系 H2O2 叶绿素荧光参数 基因表达分析 |
| 英文关键词:Wheat Albinism line H2O2 Chlorophyll fluorescence parameters Expression analysis |
| 基金项目:国家自然科学基金项目(30971769, 31371541) |
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| 中文摘要: |
| 为了研究低温处理下小麦叶色阶段性白化品种返白系与对照品种矮变1号叶片的H2O2含量是否存在差异，并初步分析导致差异的原因，采用DAB组织染色法检测返白系和矮变1号在4 ℃低温处理90 d、25 ℃下恢复培养10 d时叶片H2O2含量的动态变化，测定4 ℃低温处理下返白系和矮变1号中表征光合电子传递效率的荧光参数Fv/Fm和qP，并采用qRT-PCR方法分析返白系和矮变1号中几个光合电子传递体基因及质体H2O2清除相关基因的表达模式。结果显示，低温处理下，矮变1号叶片中H2O2含量变化不大，返白系叶片中H2O2会大量累积；低温处理下，返白系叶片的叶绿素荧光参数Fv/Fm、qP都明显低于矮变1号。同时，低温下返白系光合电子传递链中部分电子传递体亚基基因petD、petN、ndhB和ndhK，以及质体H2O2清除相关基因APX4和HO1的表达量低于矮变1号。这些结果表明，低温处理下，相较于矮变1号，返白系叶片中会累积大量的H2O2。返白系质体中光合电子传递受阻引起电子泄露，同时质体中清除活性氧的能力下降，可能是导致返白系叶片中积累大量H2O2的原因。 |
| 英文摘要: |
| Wheat Albinism line,discovered from winter wheat Aibian 1, shows stage albinism phenomena from interior leaves under low temperature(4 ℃) for about 35 to 40 days, and then returns green when temperature rises. In order to study whether there is difference in leaf H2O2 content between Albinism line and Aibian 1 under low temperature, and analyze the reasons, the content of H2O2 was detected using the diaminobenzidine histochemical staining technique after low temperature treatment, and the chlorophyll fluorescence parameters Fv/Fm and qP of wheat leaves were measured by chlorophyll fluorescence imaging system, and the expression of photosynthetic electron transport related genes and elimination of reactive oxygen species related genes were analyzed. It was indicated that Albinism line accumulated much more H2O2 under low temperature compared with that in Aibian 1.The chlorophyll fluorescence parameters Fv/Fm and qP in wheat Albinism line that represent photosynthetic electron transfer capacity were significantly lower than those of Aibian 1 in low temperature. The expression levels of petD, petN, ndhB, and ndhK, the key genes correlated with electron transfer, and APX4 and 1 the key genes related to elimination of excessive H2O2 of plastids, were significantly declined in Albinism line compared with those in Aibian 1 under low temperature.To conclude, the electronic leakage caused by the destroy of photosynthetic electron transfer capacity is the main reason for cold-sensitive wheat Albinism line accumulating excess H2O2 compared with Aibian 1 under low temperature. This situation was exacerbated by inadequate elimination capacity of excessive H2O2 of plastids in Albinism line. |
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