To validate the application of WheatSM model,based on the global sensitivity analysis method (EFAST),wheat growth and development parameters of the WheatSM model were analyzed,and then ten key parameters were screened out to optimize,such as the basic development coefficients before heading (K1,K21,K22 and K3),the temperature coefficient from emergence to overwintering (P21),the genetic photoperiod coefficient from overwintering to jointing (Q2),the transfer rate of photosynthetic product to grain after heading (TR2) ,the specific leaf area (SLA),the partition coefficient of ear dry matter from jointing to heading (PcEar34),and the partition coefficient of leaf dry matter from heading to maturity (PcLeaf45). Based on these parameters,the global optimization algorithm (SCE-UA) was carried out,and observation data of many continuous years was used to constrain the cost function of optimization and validate the effect. The results showed that the WheatSM model has the highest accuracy for the simulation at emergence stage,with RRMSE<0.5%,and R>0.9; and it has a modest accuracy for the simulations at heading and jointing stages,but the worst accuracy for the simulation at overwintering stage. The simulation results of dry matter and LAI have high correlation to observed data,with R>0.9,but the accuracy is relatively lower (75.0%). |